It integrates high-resolution SEM, plasma FIB, and femtosecond laser ablation with Oxford EDS/EBSD, TOFWERK ToF-SIMS, and cryogenic capabilities for rapid 3D characterization, site-specific milling, TEM sample preparation, and multimodal imaging and analysis from the millimeter to nanometer scale.
This instrument was acquired through support from the U.S. National Science Foundation under MRI Grant No. 2511067.
It integrates high-resolution SEM, Ga FIB, and low-vacuum imaging with Oxford EDS, cryo-stage, and CleanConnect cryogenic transfer, enabling imaging, analysis, site-specific milling, TEM sample preparation, and cryogenic workflows for conductive, non-conductive, frozen-hydrated, and air-sensitive specimens.
A 120 kV LaB6 high resolution, analytical transmission electron microscope with Gatan UltraScan 2K bottom mount CCD camera and EDAX energy dispersive X-ray spectrometer.
This instrument was acquired through support from the U.S. National Science Foundation under MRI Grant No. 0923077.
EDS/EBSD elemental & chemical analysis
Coating, sectioning, TEM lamella lift-out
Patterning, milling & deposition
In-situ testing / heating stage
Vitrified biological samples
AFM / STM topography
Science Education and Research Center (SERC)
Room 008
info.em@temple.edu
Publications using EM Lab data must acknowledge the facility.
See here.