Temple Nano Instrumentation Center

NIC – EM | Electron Microscopy Facility

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JEOL JEM-1400

(S)TEM

A 120 kV LaB₆ analytical transmission electron microscope with STEM capability, Gatan bottom-mounted CCD camera, and energy dispersive X-ray spectrometer.

This instrument was acquired through support from the U.S. National Science Foundation under MRI Grant No. 0923077.

Electron Optical Performance

Specification TEM mode STEM mode
Accelerating voltage 40, 60, 80, 100, 120 kV Up to 120 kV
Point-to-point resolution 0.38 nm
Lattice resolution 0.20 nm
MAG mode ×200 – ×1,200,000 ×5,000 – ×2,000,000
Low MAG mode ×50 – ×1,000 ×120 – ×4,000
Selected-area MAG mode ×2,000 – ×300,000
Specimen tilt, X ±25° ±25°
High-tilt capability Up to ±70° Up to ±70°

Imaging and Analysis

TEM imaging Conventional bright-field; high-resolution imaging to 0.20 nm lattice resolution
Diffraction Selected-area electron diffraction (SAED), recorded digitally
STEM Scanning transmission imaging up to ×2,000,000
EDS EDAX Energy dispersive X-ray spectroscopy
Specimen range Biological, polymeric, soft-matter, nanomaterial and inorganic specimens
Beam-sensitive work Operation at 40, 60 or 80 kV for radiation-sensitive materials

Digital Camera

CameraGatan UltraScan 4000, Model 895 — bottom-mounted, retractable CCD
Format4k × 4k CCD (~16 megapixels), 16-bit digitisation
CouplingElectron scintillator coupled to the CCD via fused fibre-optic plate
Optical technologyGatan High-Contrast Resolution (HCR)
ReadoutFour-channel parallel CCD readout, First Light electronics
CoolingPeltier-cooled, approximately −25 °C
SoftwareDigitalMicrograph — acquisition, calibration, processing and storage

Not Trained Yet?

Complete the Helios training session with staff before independent use.