The Nano Instrumentation Center’s first workshop, focusing on our new Scios FIB-SEM, was a resounding success! This workshop ushers in a new era of nano-scale research, not just at Temple University, but also for the greater Philadelphia and Northeast regions as we christen our new Scios Dualbeam FIB-SEM platform.

Researchers from Temple University, Drexel University, the University of Pennsylvania, and industry were in attendance. Experts from Thermofisher Scientific’s Nanoport and Avizo teams led sessions covering FIB cross-sectioning, TEM sample preparation, correlative imaging, 3D materials characterization, 3D image reconstruction, and AI-assisted image analysis. Participants had the opportunity to discuss their research questions with experts from Thermofisher’s EM applications team and engage in discussion with colleagues and collaborators.

If you weren’t able to attend this workshop and are interested in learning more about the newly expanded capabilities of the NIC, please reach out to Dr. Dmitriy Dikin at ddikin@temple.edu.

We will be holding another workshop in the winter on cryo-FIB-SEM workflows. This workshop will predominantly focus on cryo-handling and imaging of biological samples. Please visit our events page for more information or complete this survey to indicate your interest, receive updates about the workshop, and help us refine the dates and scope.