Sep 2 – 3, 2026 · 9:30 AM – 5:30 PM · SERC
Free two-day workshop on Scios FIB-SEM and advanced 3D microscopy and analysis.
The workshop will explore applications and research challenges across materials science and life sciences, including FIB cross-sectioning, automated TEM sample preparation, large-area and correlative imaging, and 3D characterization. Thermo Fisher application scientists will lead expert presentations, live Scios DualBeam demonstrations, and selected hands-on sessions, complemented by Avizo training in 3D visualization, segmentation, AI-assisted analysis, and quantitative workflows.
The workshop will also provide an opportunity to bring your own research questions, discuss samples and future projects, and explore potential collaborations with microscopy and image-analysis specialists.
Registration is free, but space is limited. Please register by August 26.
Science Education and Research Center (SERC)
Room 008
info.em@temple.edu
Publications using EM Lab data must acknowledge the facility.
See here.