Instruments
Helios 5 Tri Beam
SEM – PFIB – fs Laser
Triple-beam system with a femtosecond laser for millimeter-scale 3D characterization — material removal up to ~15,000× faster than a standard Ga FIB, with nanometer-resolution imaging.
Techniques
Nanofabrication
Spectroscopy
Mechanical Tests
Scios 2 DualBeam
SEM – FIB – Low Vaccum
Ga ion-beam DualBeam for site-specific TEM lamella prep, automated Slice & View 3D reconstruction, and low-vacuum imaging of magnetic or non-conductive samples.
Techniques
Specimen Prep
Nanofabrication
Spectroscopy
JEOL JEM-1400
TEM – STEM – Diffraction
Transmission electron microscope for internal structure at the nanometer scale — bright-field imaging, STEM, and electron diffraction for biological and materials samples.
Techniques
Cryo EM
Specimen Prep
Scanning Probe
Methods
Spectroscopy
EDS/EBSD elemental & chemical analysis
Helios 5 – Scios 2
Specimen Prep
Coating, sectioning, TEM lamella lift-out
Scios 2 – Helios 5
Nanofabrication
Patterning, milling & deposition
Helios 5 – Scios 2
Mechanical Tests
In-situ testing / heating stage
Helios 5 · Scios 2
Cryo EM
Vitrified biological samples
JEM-1400
Scanning Probe
AFM / STM topography