The Temple Electron Microscopy Core Facility provides high-quality electron microscopy services, instrumentation, and training to researchers across disciplines. We support research, education, and industry through consultation, advanced imaging, and materials characterization.
Life Science Research
Composites, Metals, and Alloys
Energy Storage and Battery Materials
Forensic and Failure Analysis
Construction Materials
Semiconductor and Electronics
Nanofabrication and Prototyping
Education and Training
Atomic Composition Analysis
Crystallographic and Microstructure Analysis
Elemental & Molecular Analysis
Correlative Multimodal Analysis
Surface and Interface Analysis
Nano Composition Analysis
Particle and Pore Analysis
3D Reconstruction and Rendering
SEM/TEM: Scanning/Transmission Electron Microscopy
CryoEM: Low Temperature Electron Microscopy
FIB: Focused Ga Ion Beam Microscopy
PFIB: Plasma (Xe/Ar/N/O) Focused Ion Beam Microscopy
ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry
fs-L: Femtosecond Pulse Laser
EDS: Energy-Dispersive X-ray Spectroscopy
EBSD: Electron Backscatter Diffraction
Science Education and Research Center (SERC)
Room 008
info.em@temple.edu
Publications using EM Lab data must acknowledge the facility.
See here.
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