{"id":1127,"date":"2024-07-07T15:30:00","date_gmt":"2024-07-07T19:30:00","guid":{"rendered":"https:\/\/sites.temple.edu\/dslab\/?p=1127"},"modified":"2024-11-07T15:38:22","modified_gmt":"2024-11-07T20:38:22","slug":"omidreza-is-presenting-at-acc24","status":"publish","type":"post","link":"https:\/\/sites.temple.edu\/dslab\/?p=1127","title":{"rendered":"Omidreza is presenting at ACC’24"},"content":{"rendered":"\n

This paper presents a voltage correlation method for real-time detection of the early onset of internal short circuits (ISCs) in battery modules. The lack of balancing circuitry can result in the over-discharge of a single bank (cells in parallel) in a module that may lead to a possible internal short circuit that can eventually result in high temperatures and thermal runaway We formulated a statistical framework to determine the threshold voltage correlation factor, below which it is possible to create an internal short inside a cell. Through experimental data investigation, we showed that the method is robust with respect to factors such as voltage measurement noise, variations in rest time during cycling, and short-duration current pulses. The threshold determined from a control module successfully captured the early onset of ISC due to over-discharge and the specific bank at which it occurred in a module. The low computational and hardware costs make it particularly attractive for implementation in battery management systems.<\/p>\n\n\n\n

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O. Ahmadzadeh, D. Tewari, J. Jeevarajan, and D. Soudbakhsh, “Real-Time Internal Short Circuit Detection in Li-ion Battery Modules During Field Use,”\u00a02024 American Control Conference (ACC)<\/em>, Toronto, ON, Canada, 2023, pp. 3480-3485,<\/p>\n\n\n\n

doi: 10.23919\/ACC60939.2024.10644527<\/a><\/p>\n\n\n\n\"SCImago<\/a>\n","protected":false},"excerpt":{"rendered":"

This paper presents a voltage correlation method for real-time detection of the early onset of internal short circuits (ISCs) in battery modules. The lack of balancing circuitry can result in the over-discharge of a single bank (cells in parallel) in a module that may lead to a possible internal short circuit that can eventually result … Continue reading Omidreza is presenting at ACC’24<\/span> →<\/span><\/a><\/p>\n","protected":false},"author":18182,"featured_media":0,"comment_status":"open","ping_status":"","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_themeisle_gutenberg_block_has_review":false,"footnotes":""},"categories":[13],"tags":[],"class_list":["post-1127","post","type-post","status-publish","format-standard","hentry","category-news2024"],"acf":[],"_links":{"self":[{"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=\/wp\/v2\/posts\/1127","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=\/wp\/v2\/users\/18182"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=1127"}],"version-history":[{"count":1,"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=\/wp\/v2\/posts\/1127\/revisions"}],"predecessor-version":[{"id":1131,"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=\/wp\/v2\/posts\/1127\/revisions\/1131"}],"wp:attachment":[{"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=1127"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=1127"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/sites.temple.edu\/dslab\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=1127"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}