Scanning Tunneling Microscopy (STM)
- Agilent 5500 and Picoscan SPM
- Surface imaging up to 1 µm2 in size
- Break junction measurements
- single molecule conductivity measurements
- pre-amplifiers with values from 0.1 nA/V to 1µA/V
- Preparation of STM tips:
- tungsten and gold tips
- electrochemical etching
- cutting
- coating tips for measuring in in-situ environments
Atomic Force Microscopy (AFM)
- Agilent 5500 and Picoscan SPM
- Surface imaging up to 35 µm2 in size
- Contact, tapping, and non-contact modes
- Force curve measurements
- Current sensing imaging
Measurement environments for STM and AFM:
- in ambient
- in controlled gas
- in liquid
- in electrochemical conditions
(Picoscan SPM)
